時霄

發布者:朱恺發布時間:2021-03-02浏覽次數:17232


Xiao Shi(時霄)    

Ph.D., Associate Professor

School of Computer Science and Engineering, Southeast University

I am a member of PAttern Learning and Mining(PALM) Lab. 

Email: xshi@seu.edu.cn

Office: Room 146, School of Computer Science and Engineering, Southeast University Jiulonghu Campus, Nanjing, Jiangsu, China.


時霄, 博士,副教授。1990年出生于江蘇南京,于bet356手机版唯一官网吳健雄學院獲得本科學位2012),美國加州大學洛杉矶分校電子工程系獲得碩士學位(2016)、博士學位(2020。導師為Lei He教授。2021年起在bet356手机版唯一官网登录任職副教授。現為bet356手机版唯一官网PALM實驗室成員。研究内容廣泛涉及電子設計自動化(EDA)的多個子領域,主要包括電路可靠性分析、系統級電路仿真工具開發、電路建模求解等方向工作,以及基于可重構的電路仿真硬件加速芯片研究。曾承擔一項美國Darpa項目。近年來,發表SCIEI論文10餘篇,擔任TCADTODAESTRETS等期刊審稿人。主持多項國家自然科學基金等橫縱向項目。


歡迎感興趣的本科生及研究生加入!


Selected Publications 


1.Xiao Shi, Hao Yan, Qiancun Huang, Chengzhen Xuan, Longxing Shi, Lei He. “A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation”, Transactions on Design Automation of Electronic Systems, (TODAES), 2021. (accepted)

2.Xiao Shi, Hao Yan, Chuwen Li, Jinxin Wang, Longxing Shi, Lei He. “A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis”, International Conference On Computer Aided Design, (ICCAD), 2020.

3.Xiao Shi, Hao Yan, Jinxin Wang, Jiajia Zhang, Longxing Shi, Lei He. An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, (TCAD), 2020.

4.Peng Zou, Zhifeng Lin, Xiao Shi, Yingjie Wu, Jianli Chen, Jun Yu, and Yao-Wen Chang, Time-Division Multiplexing Based System-Level FPGA Routing for Logic Verification, 57th ACM/IEEE Design Automation Conference (DAC), 2020.

5.Shan Shen, Liang Pang, Tianxiang Shao, Ming Ling, Xiao Shi, Longxing Shi, “TYMER: A Yield based Performance Model for Timing-speculation SRAM”, 57th ACM/IEEE Design Automation

Conference (DAC), 2020.

6.Xiao Shi, Hao Yan, Qiancun Huang, Jiajia Zhang, Longxing Shi, Lei He, “Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation”, 56st ACM/IEEE Design Automation Conference, (DAC), 2019.

7.Xiao Shi, Hao Yan, Jiajia Zhang, Qiancun Huang, Longxing Shi, Lei He,Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method”, International Conference On Computer Aided Design, (ICCAD), 2019.

8.Xiao Shi, Hao Yan, Jinxin Wang, Xiaofen Xu, Fengyuan Liu, Longxing Shi, Lei He, “Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis”, ACM International Symposium on Physical Design (ISPD), April 2019.

9.Xiao Shi, Jinlong Yan, Hao Yan, Jilia Zhang, Longxing Shi, Lei He,Adaptive Low-Rank Tensor Approximation for SRAM Yield Anaylsis using Bootstrp Resampling, IEEE ASIC Conference, (ASICON), 2019

10.Xiao Shi, Zhongmao Sun, Yunxuan Yu, Jun Yang, Lei He, “Low Voltage SRAM with Fault Mitigation Techniques for Energy-Efficient Convolutional Neural Networks”, in 15th Workshop on Silicon Errors in Logic – System Effects (SELSE), April 2019.

11.Yunxuan Yu, Chen Wu, Xiao Shi, Lei He, Overview of A FPGA-Based Overlay Processor, China Semiconductor Technology International Conference (CSTIC), 2019.

12.Xiao Shi, Fengyuan Liu, Jun Yang, Lei He, “A Fast and Robust Failure Analysis of Memory Circuits Using Adaptive Importance Sampling Method”, 55th ACM/IEEE Design Automation Conference (DAC). IEEE, 2018: 1-6.


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